ENGS 133: Methods of Materials Characterization


19S: 2A

Transmission Electron Microscopy; Williams and Carter; Plenum Press; NY; 030645324X (paperback). 030645324 (hardcover). Elements of X-ray Diffraction by B.D. Cullity and S.R. Stock; Addison-Wesley; 0201610914.

20S: 2A


ENGS 24 or permission

Identical to PHYS 128 and CHEM 137

This survey course discusses both the physical principles and practical applications of the more common modern methods of materials characterization. It covers techniques of both microstructural analysis (OM, SEM, TEM, electron diffraction, XRD), and microchemical characterization (EDS, XPS, AES, SIMS, NMR, RBS, and Raman spectroscopy), together with various scanning probe microscopy techniques (AFM, STM, EFM, and MFM). Emphasis is placed on the information that can be obtained together with the limitations of each technique. The course has a substantial laboratory component, including a project involving written and oral reports, and requires a term paper.

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