ENGG 339: Advanced Electron Microscopy



ENGS 133 or permission of instructor

Cannot be used to satisfy any A.B. degree requirements

Image formation and contrast are discussed for the transmission electron microscope, using both kinematical and dynamical theory. Image simulation methods are outlined and the information from a variety of diffraction methods, such as CBED, are described. Various analytical techniques such as electron energy loss spectroscopy and x-ray fluorescence, including advanced techniques such as ALCHEMI, are covered. Emphasis is placed on the applications, resolution, and theoretical and practical limitations of each technique. There are several laboratory sessions, each requiring a report.