Microstructural characterization of snow and ice cores
Microstructural characterization of snow and ice cores is crucial to understanding the effects of microstructure and impurities in ice. Researchers here pioneered a way to use the scanning electron microscope (SEM) to study the impurities in uncoated ice and have recently developed a way to gather precise orientation information from ice using electron back scatter patterns (EBSP). Dartmouth engineers are also investigating the type and location of impurities in polar ice cores using a confocal Raman microscope. These efforts will further scientists' understanding of the effect of microstructural properties of ice on the mechanical behavior of ice sheets and glaciers and help paleoclimatologists better interpret the ice core record.
Faculty contact: Ian Baker